Prof. Dr. rer. nat. Lothar Frey


Name:Prof. Dr. rer. nat. Lothar Frey
Postal address:Lehrstuhl für Elektronische Bauelemente

Cauerstr. 6
91058 Erlangen
Room:1.122
Phone number:09131/85-28633
Fax number:09131/85-28698
E-mail:lothar.frey@leb.eei.uni-erlangen.de
Office hours:weekly on tuesday 9:00 - 10:00

1.122

Bitte bei Sekretariat (1.121) anmelden.

Courses / Lectures

Supervised theses

2013

2012

2011

2010

2009

2002

1999
  • Optimierung des Reinigungsverfahrens „Standard Clean 1 (SC1)"
1997

1996

1995

1994

1993

1992

Publications

2013

2012

2011

2010

2009

2008

2007

2006

2005

2004

2003

2002

2001

2000

1999
  • »AFM and STM Investigation of Carbon Nanotubes Produced High Energy Ion Irradiation of Graphite«, Nuclear Instruments and Methods in Physics Research 147, 142 (1999)
  • »An Analytical Model for Beam Induced Contamination in Ion Implantation«, 12th International Conference on Ion Implantation IIT 98, Kyoto (Japan), 498-501 (1999),
    externer Link: OPUShttp://nishiki.kuee.kyoto-u.ac.jp/IIT98/
  • »Carbon Nanotubes Produced by High Energy (E>100MeV) , Heavy Ion Irradiation of Graphite«, Nuclear Instruments and Methods in Physics Research 148, 1102 (1999)
  • »Comparisation of Beam-Induced Deposition Using Ion Microprobe«, Nuclear Instruments and Methods in Physics Research 148, 25 (1999)
  • »Forming Nitrided Gate Oxides by Nitrogen Implantation into Substrate before Gate Oxidation by RTO«, IEEE Electron Device Letters, 26 (1999)
  • »Impurity Incorporation during Beam Assisted Processing Analyzed Using Nuclear Microprobe«, Nuclear Instruments and Methods in Physics Research 158, 487 (1999)
  • »Investigation of Cu Films by Focused Ion Beam Induced Deposition Using Nuclear Microprobe«, Nuclear Instruments and Methods in Physics Research 158, 493 (1999)
  • »MOCVD of Ferroelectric Thin Films«, Journal de Physique IV 9, 575-582 (1999)
  • »Nano-slit probes for near-field optical microscopy fabrcated by focused ion beams«, Journal of Microscopy 194, 335-339 (1999)
  • »Scanning Probe Method Investigation of Carbon Nanotubes Produced by High Enery Ion Irradiation of Graphite«, Carbon-Based Materials for Microelectronics 37, 739 (1999)
  • »Simulation of a Coating Protection for an In Situ Ellipsometer in a CVD Furnace«, Proceedings 29th European Solid-State Device Research Conference (ESSDERC99), Leuven (Belgien), 3 (1999)

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